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Subsystem symmetry, spin-glass order, and criticality from random measurements in a two-dimensional Bacon-Shor circuit

Cornell Affiliated Author(s)

Author

Vaibhav Sharma
Chao-Ming Jian
Erich Mueller

Date Published

Journal

Physical Review B

Volume

108

Issue

2

ISSN Number

2469-9950, 2469-9969

URL

https://journals.aps.org/prb/abstract/10.1103/PhysRevB.108.024205

DOI

10.1103/physrevb.108.024205

Group (Lab)

Chao-Ming Jian Group

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