Skip to main content

High-speed imaging at high x-ray energy: CdTe sensors coupled to charge-integrating pixel array detectors

Cornell Affiliated Author(s)


J. Becker
M.W. Tate
K.S. Shanks
H.T. Philipp
J.T. Weiss
P. Purohit
Darol Chamberlain
Sol Gruner


Pixel Array Detectors (PADs) consist of an x-ray sensor layer bonded pixel-by-pixel to an underlying readout chip. This approach allows both the sensor and the custom pixel electronics to be tailored independently to best match the x-ray imaging requirements. Here we describe the hybridization of CdTe sensors to two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory. The charge-integrating architecture of each of these PADs extends the instantaneous counting rate by many orders of magnitude beyond that obtainable with photon counting architectures. The Keck PAD chip consists of rapid, 8-frame, in-pixel storage elements with framing periods <150 ns. The second detector, the MM-PAD, has an extended dynamic range by utilizing an in-pixel overflow counter coupled with charge removal circuitry activated at each overflow. This allows the recording of signals from the single-photon level to tens of millions of x-rays/pixel/frame while framing at 1 kHz. Both detector chips consist of a 128×128 pixel array with (150 μm)2 pixels. © 2016 Author(s).

Date Published

Conference Name





Group (Lab)

Sol M. Gruner Group

Download citation